Optical spectrum analyser halves test times

April 15, 2019 //By Nick Flaherty
Optical spectrum analyser halves test times
Anritsu has launched a spectrum analyse for evaluating the output characteristics of optical active devices used by optical communications systems that cuts evaluation times in half. 

The MS9740B keeps the same measurement-sensitivity performance, functions, and size as the predecessor MS9740A while shortening measurement processing times by 50 percent to 0.35s improve production-line efficiency by optimising the optical receiver bandwidth settings, most commonly used by customers. This performance upgrade cuts optical active device inspection times and increases production-line efficiency.

The spread of next-generation 5G mobile and Cloud communications services is expected to increase data traffic volumes massively. Networks supporting this infrastructure are experiencing explosive jumps in network traffic, which demands both increased module production and shorter inspection times to allow in-time delivery required for the rapid expansion and adoption of faster rate optical modules at 10G, 100G, and 400G bit rates.

The benchtop MS9740B features wide dynamic range, high resolution, and fast sweep speeds over a wavelength range of 600 to 1750 nm. The device supports multimode fibre input for manufacturing and evaluating 850nm band VCSEL modules. As well as keeping the same functions and performance as its predecessor, it cuts measurement processing times by up to half (Rx bandwidth setting: 1 kHz or 200 Hz) while overcoming problems of decreased measurement sensitivity caused by increased processing speed.

The single mode supression ratio (SMSR) measurement at 45 dB minimum supports 600 to 1750 nm frequencies for evaluating all optical active devices while the measurements speed of 0.35s for a wavelength sweep, analysis, and data transfer to remote server, sweeping in fast mode on a 30nm wavelength reduces the test times.

The MS9740B retains the optical active device (LD-Module, DFB-LD, FP-LD, LED, WDM and Optical Amplifier (NF and Gain) measurement menu screens for evaluating devices and supports all-at-once measurements of key evaluation items, such as optical centre wavelength, level, OSNR, spectrum width, etc., and displays these results on one screen

www.anritsu.com


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