The NeoSpectra-Scanner is built around the company's NeoSpectra spectral sensor technology, with a wide spectral range for many applications. The scanner, says the company, is expected to help drive on-site material analysis into a broad range of industries.
"We have seen a high degree of interest in handheld material analysis from several key industries," says Dr. Bassam Sadaany, business unit manager, Si-Ware Systems. "They wanted to avoid the lag time of sending samples to a lab and also wanted their teams to have an out-of-the-box and cost-effective solution that didn't require hours of development or calibration time. We developed the NeoSpectra-Scanner to enable both resellers and in-house teams to easily and quickly develop critical applications for almost any field or industrial environment."
The scanner enables users to add on-site intelligence in their operations, instantly identifying and quantifying composition of materials used in farming, food processing, and industry. The device features a streamlined five-step application development designed to enable users to quickly deploy the tool to the field for their market of choice.
The NeoSpectra core technology is already in use in portable soil analysis and animal feed scanning, and in health and beauty applications such as hair analysis at professional salons. Its use in a handheld format, says the company, could find applications in life science and food safety industries, as well as cannabis - where spectroscopy can help with both soil and product analysis - and in sorting of plastic waste.
In addition to being smaller, lighter, and more hardware- and software-ready than other portable scanners on the market, says the company, the NeoSpectra-Scanner has a large spot size (up to 10 mm) for measuring non-homogenous materials such as grains and soils. It is also ruggedized for in-field use, conforming to IP65 protection standards.
The device is designed not only for point-and shoot-capability but also to rest on flat surfaces for above-scanner sampling, or for below-scanner sampling from a