The company’s unified development and debug environment XJDeveloper makes it quick and easy to set up and run JTAG tests, detecting faults on high-density boards without costly test fixtures or functional testing.
The v3.6 release incorporates a new documentation feature in XJEase files so that users can label methods in the XJEase file which can be allocated to testing specific saved devices. These labels are used by the ‘automatic test list creation’ feature to further accelerate test setup.
From now on, there will be no need to create test groups for each type of device and manually add the test function for each individual device to the relevant test group.
With the new v3.6 release, CheckChain and Connection Test are automatically added to the test list when a new project is created. When a device is categorised, XJDeveloper will find its relevant test function and add it to the test list. The test list can also be populated at the end of a project setup via the “Suggest Tests…” button. The automated matching allows faster board set up times.
The new global built-in test functions RUNSVF and RUNSTAPL simplify the running of SVF/STAPL files which is especially beneficial for in-system programming of CPLD/FPGA using these types of file. The built-in character of these functions allows a noticeable simplification of the programming process.
XJTAG now allows users to specify arrays of the built-in XJEase types (INT, STRING, FILE) to make operations much easier to program. Version 3.6 of XJTAG also adds views of the call stack and of the currently-set breakpoints to the XJEase debugger in XJDeveloper, completing its debugging capabilities by enabling a view of the stack of functions which have been called to get to the current point in the code, and allowing the user to easily view and remove breakpoints from the code.
XJTAG - www.xjtag.com