Test system adapted for advanced PCIe Gen 4 Solid-State Drives

August 01, 2018 // By Nick Flaherty
Advantest Corporation has introduced the industry’s first fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD).

The system is based on the MPT3000 platform, the same tester used by leading manufacturers of PCIe Gen 3, SATA and SAS SSDs.

The MPT3000 platform can now cover all test insertions for PCIe Gen 4 devices – from engineering with the MPT3000ES to reliability demonstration testing (RDT) with the MPT3000ENV to production testing with the MPT3000HVM – without waiting for third-party PCIe Gen 4 SSD applications to be commercially available. It streamlines the transition to the next generation of devices by offering users a test flow that spans design to manufacturing and uses the same tester architecture and software as Advantest’s PCIe Gen 3 system.

“To address the wide variety of SSD protocols and form factors, we offer our modular MPT3000 platform, which we have now enhanced to validate and test the newest generation of PCIe memories,” said Colin Ritchie, vice president of system-level test at Advantest. “This highly flexible system’s tester-per-DUT architecture and hardware-acceleration make it a single-system solution for virtually all engineering, volume production and BIST (built-in self-test) applications.”

MPT3000 PCIe Gen 4 products are now available and shipments to customers have begun.

www.advantest.de


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