The FVI16 floating power VI source can be added to the V93000 single scalable platform for testing power and analogue ICs in automotive, industrial and consumer mobile-charging applications such as the growing e-mobility and rapid charger market. With 250W of high-pulse power and up to 40W of DC power, the source provides sufficient power for the latest devices while conducting stable and repeatable measurements.
“Our enhanced power resource gives the V93000 platform the industry’s best VI signal performance and expands its coverage into new markets, making it the broadest test solution available,” said Hans-Juergen Wagner, senior vice president, SoC Business Group at Advantest.“With the FVI16, this versatile test platform is equipped for testing semiconductors for a wider range of power-management devices, from airbags and ABS (anti-lock braking system) controllers to USB-C chargers and cordless power tools.”
The system’s digital feedback loop design provides higher levels of measurement accuracy and analogue/power performance compared with traditional analogue feedback. The digital feedback technology offers several features including spike-free “smart connections” with constant Kelvin monitoring for reliable and highly precise measurements. User-controllable slew rate and bandwidth settings allow fast settling times adapted to the respective load conditions.
The FVI16 unit supports sixteen channels with four-quadrant operation allow for source ganging of up to 155 amps per card on high-current tests. For high-voltage testing, source stacking of up to +180 volts per card within a floating range of + 200 volts can be achieved. This allows small system configurations that fit into Advantest’s A-Class test head and therefore lowers cost of test.
The FVI16’s patented integrated fast current clamp protects the loadboard hardware, probe card pins and DUT sockets in case a damaged device creates a short circuit.
Customers can use the new FVI16 to extend the capabilities of their existing V93000 Smart Scale systems to the higher voltages, increased channel count and power demands for high-site-count IC testing while maintaining a low cost of test.
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