50Mpixel CCD image sensor to inspection smartphone displays

October 29, 2018 // By Julien Happich
ON Semiconductor is enabling more efficient inspection of smartphone displays with the introduction of a new 50 megapixel (MP) resolution charge-coupled device (CCD) image sensor.

As the highest resolution Interline Transfer CCD image sensor commercially available, the KAI-50140 provides the critical imaging detail and high image uniformity needed not only for inspection of smartphone displays but also circuit board and mechanical assembly inspection as well as aerial surveillance.

The KAI-50140 is designed in a 2.18 to 1 aspect ratio to match the format of modern smartphones, reducing the number of image captures required to inspect a full display. The 4.5 µm Interline Transfer CCD pixel used in the KAI-50140 provides high resolution with a true electronic (global) shutter while preserving critical imaging performance. The new device supports frame rates up to 4 fps through the use of flexible 1, 2, or 4 output readout architecture, and shares the same pin definitions as previous 29 Mpixel offerings so it can be incorporated into existing camera designs with only minor electrical changes.

ON Semiconductor - www.onsemi.com


Vous êtes certain ?

Si vous désactivez les cookies, vous ne pouvez plus naviguer sur le site.

Vous allez être rediriger vers Google.